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NCMIR scientist selected to judge the annual Nikon Small World Photomicrography Competition

Thomas Deerinck

Thomas Deerinck, a Research Scientist at the National Center for Microscopy and Imaging Research at UCSD, has been chosen as a judge in the Nikon Instruments, Inc. 33rd International Small World Photomicrography Competition.

May 2007 — Nikon Instruments Inc. has announced the judging panel for the 33rd International Small World Photomicrography Competition. The competition recognizes excellence in photomicrography, and celebrates an alliance between art and science as captured through the lens of the optical microscope. This year's competition continues to build on past success by attracting thousands of entries submitted by professional and amateur microscopists from around the globe.

Judges chosen by Nikon for this year’s competition include: John Hart, an Atmospheric and Oceanic Science Professor at University of Colorado; Malcolm Ritter; AP Science Writer; Daniel Sieberg; Science & Technology correspondent for CBS News; Nicole Dyer; Senior Editor at Popular Science; and Thomas Deerinck, a Research Scientist at the National Center for Microscopy and Imaging Research at UCSD.

Deerinck was selected to be a judge this year by Nikon because he is widely regarded as an authority in microscopic imaging methodologies. He has co-authored over 100 scientific papers, abstracts and book chapters and his work has appeared in such prestigious scientific journals as Nature, Science, and Cell. In addition, his images have been featured in museum shows and on the covers of numerous scientific journals. In the four years that he has entered the Nikon Small World Competition, he has garnered a 1st , 2nd, 4th, 6th, and 8th place as well as 2 honorable mentions.

The judging will take place at Nikon’s headquarters in Melville, NY in May and the winners announced at a gala celebration in New York in September. For additional information, see http://www.nikonsmallworld.com.

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2005 Nikon Small World Award

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2003 Nikon Small World Award

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